污水处理设备 污泥处理设备 水处理过滤器 软化水设备/除盐设备 纯净水设备 消毒设备|加药设备 供水/储水/集水/排水/辅助 水处理膜 过滤器滤芯 水处理滤料 水处理剂 水处理填料 其它水处理设备
英国马尔文仪器有限公司
英国马尔文仪器有限公司
Semyos能量色散式X射线荧光光谱仪
品牌 PANALYTICAL/帕纳科
Semyos能量色散式X射线荧光光谱仪仪器简介：
PANalytical's Semyos energy-dispersive XRF wafer analyzer is the latest of our successful process control tools designed specifically for semiconductor and data storage metrology. This versatile instrument determines layer composition and thickness uniformity for a wide range of process films.
Moreover, with its<23um FWHM microspot, it is able to measure in the scribelines or in dedicated metrology areas on production wafers.
The Semos wafer analyzer is an advanced metrology tool that addresses the Semyos能量色散式X射线荧光光谱仪following industry demands:
* On-product thin film metrology
* In-line process control
* Simultaneous determination of film thinkness and composition
* Ability to characterize single films and multi-layer stacks
* Excellent repeatability and reproducibility (Gauge R&R)
* Minimal COO through excellent uptime, high throughput and minimum consumption of utilities
主要特点：
Semyos: Addressing the needs of the semiconductor and data storage industry.
Microspot XRF analysis on production wafers
Versatile wafer handling
For in-line production XRF analysis
Designed for ease-of-use
您感兴趣的产品PRODUCTS YOU ARE INTERESTED IN
环保在线 设计制作，未经允许翻录必究 .
请输入账号
请输入密码
请输验证码
